Abstract
We have performed photothermal (PT) measurements by atomic force microscopy, by which nonradiative recombination of photoexcited carriers can be examined very locally, on Cu(In,Ga)(S,Se) <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$_{2}$</tex-math></inline-formula> (CIGSSe) materials in order to investigate CsF-treatment effects. From the PT signal images taken under various photoexcitation conditions and by comparing those images taken on CIGSSe samples with or without the CsF-treatment, we have found the possibility that the nonradiative recombination centers, which should exist along grain boundaries and may be distributed at a CdS/CIGSSe interface, are well passivated by the CsF-treatment.
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