Abstract
Biaxially textured YBa 2Cu 3O 7− x (YBCO) films were grown on inclined-substrate-deposited (ISD) MgO-textured metal substrates by pulsed laser deposition. CeO 2 was deposited as a buffer layer prior to YBCO growth. CeO 2 layers of different thickness were prepared to evaluate the thickness dependence of the YBCO films. The biaxial alignment features of the films were examined by X-ray diffraction 2 θ-scans, pole-figure, ϕ-scans and rocking curves of Ω angles. The significant influence of the CeO 2 thickness on the structure and properties of the YBCO films were demonstrated and the optimal thickness was found to be about 10 nm. High values of T c = 91 K and J c = 5.5 × 10 5 A/cm 2 were obtained on YBCO films with optimal CeO 2 thickness at 77 K in zero field. The possible mechanisms responsible for the dependence of the structure and the properties of the YBCO films on the thickness of the CeO 2 buffer layers are discussed.
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