Abstract

AbstractWe investigated the effects of capping layer on the crystallization of amorphous top‐CoFeB electrode in the glass/CoFeB/MgO(001)/CoFeB/cap stack. Evolution of texture and crystallization of the top‐CoFeB electrode can be affected by the texture and the crystallinity of the capping layer. When the (002)‐textured Ru capping layer was used, a (110) texture of CoFeB was developed during annealing at 350 °C for 90 min. On the other hand, when the amorphous TiAl capping layer was used, a (002) texture of the CoFeB was developed during crystallization due to MgO (001) texture seeding effect. Consequently, the texture evolution of the amorphous top‐CoFeB electrode during annealing could be controlled by the texture and crystallinity of the adjacent capping layer. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.