Abstract
Boronizing of silicon steel is performed by electrodeposition in KCl-NaCl-NaF-Na2B4O710H2O molten salts with different amounts of borax. The effect of borax content on composition and microstructure of boride layer is studied. The compositional depth profile of boride layer is measured using the glow discharge spectrometry (GDS) and the depth from the surface to the substrate is taken as the layer thickness. The surface morphology is studied by atomic force microscopy (AFM). It is found that the thickness of the boride layer reached maximum values when the borax content is 0.05mol. The roughness decreases with raising borax content from 0.01 to 0.05mol while the further increase of borax content from 0.05 to 0.1mol results in increase of roughness. The boride layer formed at borax content 0.05 mol shows smallest values of surface roughness.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
