Abstract
Effect of atomic number of operating gas on hard x-ray and ion beam emission from plasma focus have been studied. Circuit analyses have been done quantitatively to measure plasma voltage and inductance of focusing plasma. The results show increasing the atomic number of gas, increase the energy of generated ions, intensify the radiation of hard x-r a y, and enhancing the amount of injected energy in to plasma during the pinching time. Based on the measured plasma inductance and injected energy in to plasma it is speculated that increasing atomic number (Z≥18) might drive the condition of radiation-enhanced compression during pinch phase.
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