Abstract
The influence of annealing under several atmospheres on the structural and optical properties of Cu2ZnSnS4 (CZTS) thin films was investigated. Thin films were deposited on ordinary glass substrates by vacuum thermal evaporation method. In order to optimize the growth of CZTS films, the samples were annealed under different atmospheres: vacuum, nitrogen (N2), Sulfur (S2) and under vacuum followed by sulfuration. The structural study of CZTS films was carried out using the X-ray diffraction. The spectra indicated the improvement of the crystalline quality of CZTS films after the thermal treatments. All annealed films exhibited a preferential orientation along the (112) plane. The optoelectronic properties of CZTS thin films were investigated using UV–Visible spectrophotometry. The optical study of annealed samples revealed a high absorption coefficient that exceeded 104 cm−1 and a band gap in the range of 1.48–1.56 eV.
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