Abstract

Bismuth vanadate (BiVO4) has been used as the photoanode electrodes in ferroelectric solar cells owing to its unique combination of properties: a narrow bandgap among ferroelectrics, economic viability, negative conduction band edge, and remarkable stability. The present work explores the fabrication and characterization of BiVO4 thin films prepared via spin coating, with a specific focus on elucidating the influence of the annealing temperature (400–550 °C) on their structural, optical, and photovoltaic properties. From X-ray diffraction (XRD) analysis, it is observed that higher annealing temperatures have promoted the formation of larger grains, enhanced crystallinity, and induced a preferred crystal orientation characteristic of the monoclinic scheelite structure. Tauc plot analysis shows the dependence of the optical band gap on the annealing temperature for BiVO4 thin films. The band gap values have decreased slightly from 2.50 eV at 400 °C to 2.44 eV at 550 °C. This is indicated by the slightly narrowed bandgap, which influences the structure of the material or defect states at higher annealing temperatures. A narrower bandgap allows for the absorption of lower-energy light, potentially improving the light absorption efficiency of BiVO4 thin films in photoanode applications. The influence of annealing temperature on BiVO₄ thin film solar cell performance was investigated further through the analysis of open-circuit voltage (Voc), short-circuit current (Isc) and power conversion efficiency.

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