Abstract
The effect of annealing on the structure and microwave magnetic properties of composite single-layer and multilayer films is investigated. It is found that as the threshold annealing temperature is attained, the width of the FMR line increases abruptly, depending on the concentration ratio of metallic alloy and dielectric. It is shown that the FMR line broadening is also associated with the occurrence of and increase in high-frequency modes of absorption. The surfaces of annealed and unannealed films are investigated at various concentrations of metallic alloys and dielectrics using an atomic force microscope. The strong change in the magnetic characteristics after film annealing is associated with a change in surface roughness and inhomogeneity, and in the size distribution of nano- and submicron formations and their spacing.
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