Abstract
The effect of an external electric field on the probability for ions to escape from recombination in groups of multiple ion pairs in irradiated nonpolar liquids is studied theoretically. It is shown analytically that the escape probability increases linearly with increasing field in the low-field limit and that the slope-to-intercept ratio in this limit is given by the same constant as that derived by Onsager for the case of a single ion pair. This result is in agreement with recent Monte Carlo results on multi-pair spurs reported by Bartczak and Hummel.
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