Abstract
Effects of alumina and chromium interlayers on the microstructure andoptical properties of thin Ag films are investigated by using spectrophotometry, x-ray diffraction and AFM. The characteristics of Agfilms in Ag/glass, Ag/Al2O3/glass and Ag/Cr/glass stacks are analysed.The results indicate that the insertion of an Al2O3 or Cr layer decreasesthe grains and influences the reflectance of Ag films. The reflectanceof the Ag film can be increased by controlling the thickness of aluminainterlayer. The stability of Ag films is improved and the adhesion ofAg films on glass substrates is enhanced by alumina as an interlayer.
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