Abstract
In the present work, we investigate the effect of aging phenomena on the electrical conductivity of Ge20Te80 glass by performing the impedance spectroscopic measurements over a wide range of frequencies (10 mHz to 1MHz) between temperatures 133K to 393K. Experimental details indicate that aging is accompanied by the drift in structural and electrical properties away from their crystalline phase which is completely different behaviour from conventional glass systems. In addition to that the temperature dependent electrical conductivity measurements reveal that a change in defect density plays a crucial role in determining the electrical transport behaviour. We interpret the temperature dependent dc conduction mechanism for differently annealed glasses in terms of Meyer-Nedel (MN) rule modified by correlated barrier hopping model (CBH). The density of defect states, electrical bandgap, activation energy and dielectric constant are estimated and found to be very much dependent on the thermal history of glasses.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
