Abstract
A polarized light scanning optical microscopy is an important imaging technique popular for its ability to determine the information on molecular orientation of the sample being studied. The determination of the molecular orientation directly depends on the electric field orientation around the focus of a lens, which is used to focus the light to illuminate the sample. In this paper, we present the effect on the electric field orientation at the focal plane of the lens due to the presence of a few primary optical aberration present in the light beam.
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