Abstract
The effect of a MgO interlayer on the structural and magnetic properties of Co2Cr0.6Fe0.4Al (CCFA) thin films epitaxially grown on GaAs substrates by sputtering was investigated. When the MgO interlayer thickness was 1.0nm or less, the CCFA films were grown with a cube-on-cube relation to GaAs and no significant decrease in either the x-ray diffraction intensity or saturation magnetization was observed. In contrast, when the MgO thickness was 1.5nm or more, the CCFA film was rotated by 45° in the (001) plane with respect to GaAs, and both the x-ray diffraction intensity and saturation magnetization decreased. All samples showed strong magnetic anisotropy, in which a uniaxial anisotropy with an easy axis of [110]GaAs or [1−10]GaAs dominated with a slight cubic anisotropy having an easy axis of ⟨110⟩CCFA superimposed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
