Abstract
The structural, magnetic, and magnetostrictive properties of 75nm Fe100−xGax films (0⩽x⩽30) have been studied to determine how a forming field during growth affects these properties. Two film sets were grown using a cosputtering-evaporation technique with and without a forming field of 65kAm−1. Using x-ray diffraction, the texture, lattice parameter, and the grain size were determined. An out-of-plane ⟨110⟩ texture was found for all films. The magnetization loops were measured on a magneto-optic Kerr effect magnetometer, from which the anisotropy symmetry was inferred from the remanent magnetization. It was found that the forming field produced a pronounced uniaxial anisotropy. The effective magnetostriction constant was measured using the Villari effect. The effective magnetostriction constant was compared with that calculated for a polycrystalline film with ⟨110⟩ out-of-plane texture using bulk constants, and the results are discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
