Abstract
The properties of nonrectifying AuGe/GaAs (Al0.4Ga0.6As) contacts exposed to heat treatment, 60Co γ radiation, and γ radiation combined with the application of an electrical bias are studied. A correlation between the type of interfacial interaction in the contacts and their resistance is found. Results obtained are explained in terms of a diffusion model with a movable boundary of the metal layer.
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