Editors' Choice Communication—Comparison of Nanoscale Focused Ion Beam and Electrochemical Lithiation in β-Sn Microspheres

Saya Takeuchi,Truman M Wilson,Jabez J Mcclelland,Kevin A Twedt,William R Mcgehee,Vladimir P Oleshko,Christopher L Soles,Eddie H Chang,Jennifer L Schaefer

doi:10.1149/2.1161606jes

Abstract

The development of Li focused ion beams (Li-FIB) enables controlled Li ion insertion into materials with nanoscale resolution. We take the first step toward establishing the relevance of the Li-FIB for studies of ion dynamics in electrochemically active materials by comparing FIB lithiation with conventional electrochemical lithiation of isolated β-Sn microspheres. Samples are characterized by cross-sectioning with Ga FIB and imaging via electron microscopy. The Li-FIB and electrochemical lithiated Sn exhibit similarities that suggest that the Li-FIB can be a powerful tool for exploring dynamical Li ion-material interactions at the nanoscale in a range of battery materials.

Highlights

The development of Li focused ion beams (Li-FIB) enables controlled Li ion insertion into materials with nanoscale resolution
We take the first step toward establishing the relevance of the Li-FIB for studies of ion dynamics in electrochemically active materials by comparing FIB lithiation with conventional electrochemical lithiation of isolated β-Sn microspheres
The Li-FIB and electrochemical lithiated Sn exhibit similarities that suggest that the Li-FIB can be a powerful tool for exploring dynamical Li ion-material interactions at the nanoscale in a range of battery materials

Summary

Introduction

The development of Li focused ion beams (Li-FIB) enables controlled Li ion insertion into materials with nanoscale resolution. The Li-FIB and electrochemical lithiated Sn exhibit similarities that suggest that the Li-FIB can be a powerful tool for exploring dynamical Li ion-material interactions at the nanoscale in a range of battery materials. In the Li-FIB lithiation process, a focused ion beam with spot size of a few tens of nanometers and kinetic energy of a few kiloelectronvolts is directed at a sample in vacuum and scanned across the area of interest.

Results

Conclusion