Abstract
TDMR welcomes Dr. Abhisek Dixit as a new member of the TDMR Editorial Board. Dr. Dixit is an expert on device characterization and modelling of different nanometer technologies, such as bulk Si, PD, and FD-SOI BiCMOS. His experience will be of great help in reviewing and evaluating technical aspects, such as quantum computing hardware, CMOS hot-carrier and radiation effects, pulsed/RF characterization and modelling of advanced FET devices. Dr. Dixit earned his Ph.D. in 2007 from IMEC, Belgium.
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More From: IEEE Transactions on Device and Materials Reliability
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