Editorial: A test of time across the generations

Abstract

Software Testing, Verification and ReliabilityVolume 14, Issue 2 p. 79-80 EditorialFree Access Editorial: A test of time across the generations Martin Woodward, Martin Woodward m.r.woodward@csc.liv.ac.uk Search for more papers by this author Martin Woodward, Martin Woodward m.r.woodward@csc.liv.ac.uk Search for more papers by this author First published: 18 May 2004 https://doi.org/10.1002/stvr.297Citations: 1AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article. REFERENCES 1Dijkstra E. Go to statement considered harmful. Communications of the ACM 1968; 11(3): 147– 148. 2Myers GJ. The Art of Software Testing. Wiley: New York, 1979. 3DeMillo RA, Lipton RJ, Sayward FG. Hints on test data selection: Help for the practicing programmer. IEEE Computer 1978; 11(4): 34– 41. 4Ramamoorthy CV, Ho SF, Chen WT. On the automated generation of program test data. IEEE Transactions on Software Engineering 1976; 2(4): 293– 300. 5Brown JR. Practical applications of automated software tools. Technical Report TRW-SS-72-05, TRW Systems Engineering and Integration Division, One Space Park, Redondo Beach, CA, September 1972. (Also presented at the Western Electronic Show and Convention (WESCON) 1972.) 6Gruenberger F. Program testing: The historical perspective. Presented at the ACM SIGPLAN Symposium, Chapel Hill, NC, 21–23 June 1972. Citing Literature Volume14, Issue2June 2004Pages 79-80 ReferencesRelatedInformation