Edge triggered pulse latch design with delayed latching edge for radiation hardened application

Abstract

We describe a novel edge triggered pulse latch design with delayed latching edge. Combined with dual interlocked cell (DICE) slave latch stage, the presented design is radiation hardened to both static single event upset (SEU) and dynamic single event transient (SET) on its internal sensitive nodes. Delayed latching edge design enables a new block level radiation hardening circuit design approach to trade timing resources in nontiming critical paths with the radiation hardness.