Economic design of an attribute control chart for monitoring mean life based on multiple deferred state sampling

Abstract

AbstractIn this paper, we design an attribute np control chart using multiple deferred state (MDS) sampling under Weibull distribution based on time truncated life test. This chart is constructed for monitoring the variation of mean life of the product in a manufacturing process. The optimal parameters of MDS sampling and the control limit coefficients are determined so that the in‐control average run length (ARL) is as close as to the target ARL. The optimal parameters of MDS sampling are sample size and number of successive subgroups required for declaring the current state of process. Out‐of‐control ARL is considered as a measure of the performance of proposed chart and reported with determined optimal parameters for various shift constants. The out‐of‐control ARL of the proposed chart obtained under various distributions is compared with each other. The performance of proposed control chart is compared with the performance of the existing control chart designed under single sampling. In addition, the economic design of proposed chart using variable sampling interval scheme is discussed, and sensitivity analysis on expected costs is also investigated.