Abstract
The surface dynamics of polyhedral oligomeric silsesquioxane (POSS)-functionalized polystyrene (PS-POSS) thin films above the glass transition temperature were studied by grazing-incidence X-ray photon correlation spectroscopy in order to elucidate the effects of POSS at the end of the polystyrene chains. Much slower fluctuations were observed in the surface of PS-POSS thin films than in the polystyrene thin films, despite the negligible difference in their bulk viscosity. Quantitative analysis based on fluctuation-dissipation theorem indicated that there is a high-viscosity layer at the surface of the PS-POSS films, and that the substrate interface originated from POSS segregation.
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