Abstract

In this article, design and characteristics of 20-GHz electromagnetic bandgap (EBG) common-mode (CM) filters for microstrip (MS) and stripline (SL) differential pairs are considered. CM filter notch (resonance) frequency, depth, and width at the -15 dB level are calculated from the mixed-mode S-parameters. The agreement between the measured and modeled S-parameters of the baseline structures validates the models and allows for further numerical experiments. The systematic analysis of the trends for both MS and SL filter characteristics as functions of various geometrical and material design parameters is presented. Sensitivity to various technological features (conductor surface roughness, trapezoid shape of the traces, and line length imbalance) is also analyzed. It is shown that the MS EBG structure is more sensitive and less monotonic to most of the design parameters than those for the SL. This is attributed to the less electromagnetic field containment and more complex mode structure in the MS structures as compared to the SL. Systematic sensitivity analysis allows for an optimal design of the EBG CM notch filters for any printed circuit board layer where a differential pair runs. Though the analysis is presented for 20-GHz EBG filters, most of the trends would be applicable to the filters for the other frequencies.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.