Abstract

AimTo characterize early amplitude-integrated electroencephalogram (aEEG) and single-channel EEG (aEEG/EEG) in very preterm (VPT) infants for prediction of long-term outcome.PatientsForty-nine infants with median (range) gestational age of 25 (22–30) weeks.MethodsAmplitude-integrated electroencephalogram/EEG recorded during the first 72 h and analysed over 0–12, 12–24, 24–48 and 48–72 h, for background pattern, sleep–wake cycling, seizures, interburst intervals (IBI) and interburst percentage (IB%). In total, 2614 h of single-channel EEG examined for seizures. Survivors were assessed at 2 years corrected age with a neurological examination and Bayley Scales of Infant Development-II. Poor outcome was defined as death or survival with neurodevelopmental impairment. Good outcome was defined as survival without impairment.ResultsThirty infants had good outcome. Poor outcome (n = 19) was associated with depressed aEEG/EEG already during the first 12 h (p = 0.023), and with prolonged IBI and higher IB% at 24 h. Seizures were present in 43% of the infants and associated with intraventricular haemorrhages but not with outcome. Best predictors of poor outcome were burst-suppression pattern [76% correctly predicted; positive predictive value (PPV) 63%, negative predictive value (NPV) 91%], IBI > 6 sec (74% correctly predicted; PPV 67%, NPV 79%) and IB% > 55% at 24 h age (79% correctly predicted; PPV 72%, NPV 80%). In 35 infants with normal cerebral ultrasound during the first 3 days, outcome was correctly predicted in 82% by IB% (PPV 82%, NPV 83%).ConclusionLong-term outcome can be predicted by aEEG/EEG with 75–80% accuracy already at 24 postnatal hours in VPT infants, also in infants with no early indication of brain injury.

Highlights

  • The high prevalence of neurodevelopmental impairment (NDI) after very preterm (VPT) birth is still a concern [1]

  • The median duration of the amplitude-integrated electroencephalogram (aEEG) ⁄ EEG recordings was 56 [14–71] h, with 32 [7–64] h per infant having sufficient technical quality for analysis of interburst intervals (IBI) and IB%

  • Follow-up at 2 years was conducted in 41 infants; eight VPT and 22 EPT infants survived with good outcome, while 11 EPT infants survived with NDI

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Summary

Introduction

The high prevalence of neurodevelopmental impairment (NDI) after very preterm (VPT) birth is still a concern [1]. Development of methods that enable early identification of acute brain injury in preterm infants is urgent, to direct overall care and inform parents about their infant’s condition, and to obtain predictive information as a basis for neuroprotective intervention. The electrocortical background pattern (BG) in the amplitude-integrated electroencephalogram (aEEG) ⁄ EEG has proved to be one of the best early predictors of outcome in term asphyxiated infants [2]. Less is known about the long-term predictive value of early aEEG ⁄ EEG in VPT infants [3,4,5,6]. The normal EEG background in VPT infants is mainly discontinuous (DC), characterized by high-voltage activity bursts and interburst intervals (IBI) of low voltage. AEEG = amplitude-integrated electroencephalogram; EPT = extremely preterm; VPT = very preterm. 0–4 h 4–8 h 8–12 h 12–16 h 16–20 h 20–24 h 24–28 h 28–32 h 32–36 h 36–40 h 40–44 h 44–48 h 48–52 h 52–56 h 56–60 h 60–64 h 64–68 h 68–72 h

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