Abstract
We discuss the electrostatic energy driven type of phase transitions in thin films. They occur under external or built-in electric fields. In the course of transition, the electrostatic energy $(\ensuremath{\propto}{E}^{2})$ discharges into structural defects. This may lead to dielectric-film breakdown or Schottky-barrier suppression in semiconductor film junctions. The ${E}^{2}$ transitions exhibit the first-order phase transition kinetics, including both the nucleation and spinodal decomposition scenarios.
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