Year-end Sale % OFF 
Abstract
The experiment of stimulating fluorine to desorb from fluorinated graphene was carried out in order to make clear the dynamical mechanism of the electron-stimulated desorption (ESD) of fluorine. X-ray photoelectron spectroscopy (XPS) with an electron beam gun accessory was used not only to stimulate fluorine to desorb, but also to characterize the concentration of fluorine after ESD. The concentration of fluorine dropped quickly following electron beam irritation. The desorption cross section of fluorine is about 1.5×10-17 cm2. It was also found that electron beam with low current density did not damage the structure of fluorinated graphene. These results confirm that it is feasible to fabricate all graphene electronics by ESD technology.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
