Dynamics of Topological Defects in a Tunnel-Diode Oscillator Lattice Loop

Abstract

This study investigates the dynamical behavior of topological defects in a tunnel-diode oscillator lattice loop. Bifurcation analyses were first developed to show that bias voltages exist, where the lattice loop allows no sink–source pair solution. In such voltages initially set sink–source pair annihilates to become a topological defect with a dislocation form of the background rotary pulses. The topological defect moves to the opposite direction as the rotary pulse. Interestingly, the former synchronizes sub-harmonically with the latter. Thus, the defect was detected using a time-domain coherent measurement of a test lattice loop fabricated on a breadboard. This paper reports the results of bifurcation analyses and measurements.