Abstract
Comprehensive time-resolved photoluminescence measurements are performed on shallow neutral donor bound excitons (D0Xs) in bulk ZnO. It is found that transients of the no-phonon D0X transitions (I6-I9 lines) are largely affected by excitation conditions and change from a bi-exponential decay with characteristic fast (τf) and slow (τs) time constants under above-bandgap excitation to a single exponential one, determined by τs, under two-photon excitation. The slow decay also dominates transients of longitudinal optical phonon-assisted and two-electron-satellite D0X transitions, and is attributed to “bulk” D0X lifetime. The fast component is tentatively suggested to represent effects of surface recombination.
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