Abstract

We have investigated the dynamics of low-energy (1–20 eV) electron-induced reactions in condensed thin films of methanol (CH3OH) through both electron-stimulated desorption (ESD) and postirradiation temperature-programmed desorption (TPD) experiments conducted under ultrahigh vacuum conditions. Results of ESD experiments, involving a high-sensitivity time-of-flight mass spectrometer, indicate that anion (H–, CH–, CH2–, CH3–, O–, OH–, and CH3O–) desorption from the methanol thin film at incident electron energies below about 15 eV is dominated by processes initiated by the dissociation of temporary negative ions of methanol formed via electron capture, a resonant process known as dissociative electron attachment (DEA). However, postirradiation TPD investigation of radicals, especially •CH2OH and CH3O• remaining in the methanol thin film, demonstrates that electron impact excitation, not DEA, is the primary mechanism by which the radical–radical reaction products methoxymethanol (CH3OCH2OH) and ethylene glycol (HOCH2CH2OH) are formed. This apparent dichotomy between the results of ESD and postirradiation experiments is attributed to the low DEA cross section for methanol compared to that of species such as halomethanes. Our results suggest that for molecules such as methanol, low-energy electron-induced electronic excitation, rather than DEA, plays a dominant role in ionizing radiation-induced chemical synthesis in environments such as the interstellar medium.

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