Abstract
Electron trapping in the oxygen vacancies of various alumina samples is analyzed using x-ray and optical emissions induced by electrons. Observed x-ray intensity variations show the presence of charges in the sample. Information on the ionicity is deduced from the electron distribution around aluminum, observed by x-ray emission between 50 and 300 K. It is shown that the stable defects are oxygen vacancies with one trapped electron. Electron trapping in these defects is analyzed by cathodoluminescence as a function of the structural characters of the sample, of the temperature, and of the irradiation conditions. Conditions for weak trapping can be deduced from these experiments.
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