Abstract
Using resistively-shunted-junction dynamics, we numerically investigate the two-dimensional XY model with random phase shift. The critical temperatures and critical exponents are determined by dynamic scaling analysis. For weak disorder strengths, the system undergoes a Kosterlitz-Thouless (KT). A non-KT type phase transition is also observed for strong disorders. A genuine continuous depinning transition at zero temperature and creep motion at low temperature are also studied for various disorder strengths. The relevant critical currents and critical exponents are evaluated, and a non-Arrhenius creep motion is observed in the low temperature phases.
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