Abstract
A new electron interferometry method has been developed and implemented in a transmission electron microscope to quantitatively analyse magnetic and electric properties emanating from objects using holograms free of artifacts and with a frequential sensitivity. This method, called dynamical holographic Moirés (DHM), is based on the double-exposure technique consisting in the superimposition of two different holograms. We improved this technique by acquiring the superimposed holograms for two well-defined excitation states of the sample and with a control of the superimposition frequency. The variations of magnetic and electrostatic fields between both excitation states can then be extracted directly from the amplitude part of the so-called interferogram. We demonstrate the efficiency of this method by studying quantitatively the magnetic field generated by a hard disk drive writing head excited by a DC and an AC current. Double exposure measurements have also been performed to study in situ electrostatic properties of a biased carbon nanocone tip. Our method opens the route to dynamical studies using the unique combination of nanoscale resolution and electromagnetic sensitivity of electron interferometry.
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