Abstract

The analytical expressions for coherent and diffuse components of the integrated reflection coefficient are considered in the case of Bragg diffraction geometry for single crystals containing randomly distributed microdefects. These expressions are analyzed numerically for the cases when the instrumental integration of the diffracted X-ray intensity is performed on one, two or three dimensions in the reciprocal-lattice space. The influence of dynamical effects, i.e. primary extinction and anomalously weak and strong absorption, on the integrated intensities of X-ray scattering is investigated in relation to the crystal structure imperfections.

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