Abstract
Intensity increase and decrease of fluorescent X-rays from the exit and entrance surfaces for the incident X-ray, respectively, are observed, when the 220 Bragg reflection of the incident radiation of wavelength 0.7093 A is excited in perfect germanium crystals with µD=9.57 and 16.0. The experiment is performed using a triple-crystal spectrometer and the radiation from a Mo target in a conventional X-ray tube monochromatized by the silicon symmetric 111 reflection and collimated by the triple 220 reflections in a channel-cut silicon crystal. The experimental intensity profiles agree well with those calculated using the intensity formulae given by Annaka (J. Phys. Soc. Jpn. Vol. 23 (1967) 372).
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