Abstract
Electric transport measurement of Ag-sheathed Bi 2−x Pb x Sr 2 Ca 2 Cu 3 O y tapes in magnetic fields H was conducted by the four-probe method to study the effect of H and sweeping rate of applied current dI/ dt on critical current. It is found that H and dI/ dt apparently affect the critical current and the V–I characteristic curve. To understand the experimental result, numerical simulation was carried out based on the collective creep model of the vortex glass. The numerical result is in agreement qualitatively with the experiment. It is shown that the influence of the applied field, temperature and vortex pinning on the normalized critical current can be reduced to a single critical current parameter n.
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