Dynamic Reliability Evaluation by First-Order Reliability Method Integrated with Stochastic Pseudo Excitation Method

Abstract

The stochastic pseudo excitation method (SPEM), which is based on the principle of pseudo excitation method (PEM), is introduced to represent the randomness of dynamic input in which the amplitude of excitation is adopted as a random variable. Based on the mathematic definition of power spectral density, a physical interpolation of the SPEM is discussed. Even if one random variable is involved in calculation, the effects of the uncertainties are required to be investigated. The SPEM offers a simple but quite effective way to solve the dynamic reliability problem. Through integrating the new algorithm into first-order reliability method (FORM), the dynamic reliability of uncertain structure subjected to random excitation is studied. A linear oscillator with three types of white noise is adopted to verify the SPEM for dynamic reliability of linear random vibration analysis. Also, the accuracy and efficiency of SPEM to handle the multi-degree-of-freedom structure is investigated in this paper.