Abstract
The spontaneous dendrite fragmentation in solidification from undercooled Si melt was analyzed by time-resolved two-dimensional x-ray diffractometry. For the sample solidified at ΔT=261K, several spots appeared at 1ms after recalescence and the subsequent transition from spots to rings occurred within ∼25ms, which suggests that the fragmentation occurred after recalescence but just at the initial stage of the plateau period. Although the present experiment supported that the driving force for the fragmentation is a capillarity effect at the plateau period, the time scale for the fragmentation differed from the current quantitative prediction.
Published Version
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