Dynamic phase measuring profilometry for rigid objects based on simulated annealing.

Abstract

This paper presents a dynamic phase measurement profilometry (PMP) method based on the simulated annealing algorithm. In dynamic PMP for rigid objects, pixel matching is an effective method to make one-to-one pixel correspondence in each captured pattern. However, pixel matching by the global traversing algorithm takes up most of the time in the whole reconstruction process. For the purpose of optimizing pixel matching and enhancing performance in dynamic PMP, the simulated annealing algorithm is introduced. By generating a random path based on the simulated annealing algorithm, it is sufficient to locate the approximate area of the measured object. Then the accurate position can be calculated by combining it with a partial traversing algorithm. The proposed method can reduce pixel matching time by 63% and increase reconstruction efficiency by 58%. Simulations and experiments prove feasibility and precision.