Dynamic parallel phase-shifting electronic speckle pattern interferometer.

Abstract

Methods for measuring variations in diffuse surfaces using electronic speckle pattern interferometry (ESPI) are widely used and well known. In this research, we present an out-of-plane ESPI system coupled to a Michelson configuration to generate simultaneous parallel interferograms with different phase shifts. The system uses circular polarization states to generate parallel phase shifted interferograms. Due to the polarization states, the fringes do not experience a contrast reduction, thus avoiding measurement errors that affect spatial or temporal phase-shifting in interferometry. The basic operating principle of polarization modulation is described, and results that represent the temporal evolution of an aluminum plate are presented. The generation of two simultaneous patterns allows one to track the dynamic performance of the plate.