Dynamic Force Microscopy

Abstract

This chapter presents an introduction to the concept of the dynamic operational mode of the atomic force microscope (dynamic AFM). While the static, or contact mode AFM is a widespread technique to obtain nanometer resolution images on a wide variety of surfaces, true atomic resolution imaging is routinely observed only in the dynamic mode. We will explain the jump-to-contact phenomenon encountered in static AFM and present the dynamic operational mode as a solution to overcome this effect. The dynamic force microscope is modeled as a harmonic oscillator to gain a basic understanding of the underlying physics in this mode.