Abstract
Properties peculiar to superconductive phenomena and derived devices permit operation of cryoelectric arrays containing failed elements. This fault tolerance extends throughout the operational life of the array and is therefore referred to as dynamic fault tolerance. A cryotron-gated, superconductive loop possesses three stable states: two with circulating current of opposite polarity and a third without circulating current. The latter can be paired with either of the circulating states to form a binary logic device which will fail safe to the noncirculating current state under all failure modes except short-circuit formation. Analysis of failure origin and technology redefinition has eliminated short circuitry as a failure mode in completed arrays. The requirements for implementation of dynamic fault tolerance are developed and illustrated in terms of successful experiences with a 20 000 gate cryoelectric array objective.
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