Abstract

The characterization of high resolution Digital to Analog Converter (DAC) involves new problems caused by their high performance. This paper presents a new method for measuring the characteristics of high resolution DACs under dynamic condition. The main principle of the proposed method is the conversion of the DAC analog output voltage to a digital code. The one that is corresponding to the equality of the DAC output voltage and reference signal by using a fast comparator, a dithering DAC and an accurate dc voltmeter. The output of the comparator is used as the control signal to register the digital input code word of the DAC in a fast memory. After digital processing the registered record of digital code words is used to determine the Integral-nonlinearity (INL) and Differential-nonlinearity (DNL) of the DAC under test.

Highlights

  • The exponential growth of electronic systems including digital signal processing led to an increasing interest in data converters

  • This paper presents a new method for measuring the characteristics of high resolution Digital to Analog Converter (DAC) under dynamic condition

  • The authors proposed in a page mentioned above [13] a dynamic DAC testing procedure based on the conversion of the DAC output level into a time interval

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Summary

Introduction

The exponential growth of electronic systems including digital signal processing led to an increasing interest in data converters. The main principle of the proposed method is the conversion of the DAC analog output voltage to a digital code. The output of the comparator is used as the control signal to register the digital input code word of the DAC in a fast memory.

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