Abstract
This work presents an application of the Walsh transform to the dynamic characterisation of analog-to-digital converters (ADCs). The Walsh Transform (WT) is an analytical operator that extracts information on ADC parameters at the bit level rather than at the channel level. The use of the WT allows the performance of an ADC to be summarised with a reduced set of values as compared to the conventional set of non-linearity errors. To limit CPU time, a fast algorithm is used to compute the WT. A characterisation environment based on this approach was developed and used to evaluate ADC performance.
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