Abstract

Frequency-dependent dynamic behaviour in piezoresponse force microscopy (PFM)implemented on a beam-deflection atomic force microscope (AFM) is analysed using acombination of modelling and experimental measurements. The PFM signal is comprised ofcontributions from local electrostatic forces acting on the tip, distributed forces acting onthe cantilever, and three components of the electromechanical response vector. Theseinteractions result in the flexural and torsional oscillations of the cantilever, detected asvertical and lateral PFM signals. The relative magnitudes of these contributions depend ongeometric parameters of the system, on the stiffnesses and frictional forces of thetip–surface junction, and on the frequency of operation. The dynamic signal formationmechanism in PFM is analysed and conditions for optimal PFM imaging are formulated.An experimental approach for probing cantilever dynamics using frequency–biasspectroscopy and deconvolution of electromechanical and electrostatic contrast isimplemented.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.