Abstract
The electrochemical reduction of 4-nitrobenzene diazonium salt has been investigated at carbon electrodes. Glassy carbon and pyrolyzed photoresist films were used as substrates to examine the attached nitrophenyl (NP) thin films using electrochemistry and atomic force microscopy (AFM). NP-films were treated to negative potential excursions in aqueous acidic conditions to electrochemically reduce the NP groups. The voltammetric responses of Fe(CN)_{6}^{3-} redox probe were recorded, and the film thicknesses monitored by an AFM mechanical scratching method that involves removing a section of the film with an AFM tip and measuring the depth profile of the trench created. A mechanism is proposed to account for the observed film changes. [DOI: 10.1380/ejssnt.2005.294]
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
