Abstract
Photoelectrochemical measurements (PECMs) of CuInS2 (CIS) nanocrystal films (NCFs) on indium-doped tin oxide coated polyethylene terephthalate were carried out in an electrolyte solution. Intensity modulated photocurrent spectroscopy (IMPS) was performed at the NCF/solution interface. IMPS quantified the kinetic constants of the photoreaction. The rate ratio of the product separation to recombination increased as a function of applied potential, while the RC time constant decreased. Interfacial reaction kinetics of MV2+ and the CIS film was revealed by means of PECMs and IMPS. The interaction of the light absorbing CIS NCFs at a hole-rich interface allow for an understanding of what might happen at an analogous n-type junction.
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