Abstract

Surface laser structuring of electrical steel sheets can be used to manipulate their magnetic properties, such as energy losses and contribute to a more efficient use. This requires a technology such as low coherence interferometry, which makes it possible to be coupled directly into the existing beam path of the process laser and enables the possibility for an 100% inspection during the process. It opens the possibility of measuring directly in the machine, without removing the workpiece, as well as during the machining process. One of the biggest challenges in integrating an LCI measurement system into an existing machine is the need to use a different wavelength than the one for which the optical components were designed. This results in an offset between the measurement and processing spot. By integrating an additional scanning system exclusively for the measuring beam and developing a compensation model for the non-linear spot offset, this can be adaptively corrected by up to 98.9% so that the ablation point can be measured. The simulation model can also be easily applied to other systems with different components and at the same time allows further options for in-line quality assurance.

Highlights

  • While the axial resolution and the axial measuring range depends on the used light source, shown in Equations (1) and (2), the used scanning lens and scanning system have a big impact on the lateral resolution, shown in Equation (3) [22]

  • It is possible to adjust the machining process to correct the offset. This requires an interruption of the machining process and a repositioning of the scanner mirrors, which would lead to a significant slowdown of the entire process

  • Communication between the machining process the calculation effort during the actual process is limited to the interpolation of interpolation and the measuring system is required so that the results can be taken, and the spot posipoints based on the correction table

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Summary

Introduction

This can be compensated by a color-corrected objective lens, but not completely or the choice of these objectives are very limited [29,30] For this to be done, it is necessary to develop a method that allows this non-linear offset to be compensated adaptively during the process, allowing direct measurement of the material ablation. The goal of the ESSIAL research project is to integrate a measuring system into the laser process For this purpose, a laboratory system will be developed and scaled up step by step to complete machine integration. In this paper the focus is on the compensation of the spot offset caused by the different wavelengths between the processing laser and the measuring system In this way, a measuring system is developed that enables 100% quality control while enabling use on an industrial scale

Measuring Principle
Development of a Laboratory Setup
Development of the of Spectrometer
Development of the Spectrometer
Offline
Measurement
Upscaling to Real World Components
Spot Shift Compensation Model
Findings
Discussion and Conclusions

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