Abstract
Dispersive XAFS is applicable to the millisecond time-resolved sequential measurement. DXAFS apparatus consists of a bent crystal (polychromator) and a position sensitive detector. There is no mechanical movement during the measurement. The time resolution of DXAFS is suitable to analyze chemical reactions started by introducing a reactant. XAFS spectrum of short-lived reaction intermediate can be obtained from DXAFS experiment. The formation of intermediate CoO species has been confirmed during the oxidation process of supported Co catalyst to Co3O4. Reaction kinetics is also an important information obtained from the time change of X-ray absorbance. The reaction mechanism of H2 reduction process of supported metal oxide catalysts was analyzed by the DXAFS technique. It is clarified that the oxygen migration process is a key step in the reduction of supported metal oxides.
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