Abstract
Photothermal spectroscopy (PTS) working in the mid-infrared region is an effective technique for in-situ characterization of the chemical composition of surface contaminants. The sensitivity relies on the way that the laser-induced response of the sample is detected. We present a highly-sensitive PTS assisted with a dual-wavelength Mach-Zehnder interferometer (MZI), MZI-PST in short. The MZI aims to sense all the phase delays taking place at the sample and air when the heat produced by resonance absorption of the contaminant is transferred into its surroundings and further to amplify the total phase delay to a large intensity difference of a probe beam. To guarantee a stable quadrature phase bias of the MZI working in the balanced detection mode, we employ two separate wavelengths, one for sensing and the other for phase bias feedback, to lock the working point to the quadrature point in real time. The MZI is expected to have a 7.8-fold sensitivity enhancement compared with the conventional phase-sensitive PTS in theory. The results of the proof-of-concept experiment on the olive oil contaminated on a wafer surface verify the spectral fidelity and the sensitivity enhancement as well as the capability of photothermal spectral imaging of the MZI-PST.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
