Dual-sensitivity profilometry with defocused projection of binary fringes.

Abstract

A dual-sensitivity profilometry technique based on defocused projection of binary fringes is presented. Here, two sets of fringe patterns with a sinusoidal profile are produced by applying the same analog low-pass filter (projector defocusing) to binary fringes with a high- and low-frequency spatial carrier. The high-frequency fringes have a binary square-wave profile, while the low-frequency binary fringes are produced with error-diffusion dithering. The binary nature of the binary fringes removes the need for calibration of the projector's nonlinear gamma. Working with high-frequency carrier fringes, we obtain a high-quality wrapped phase. On the other hand, working with low-frequency carrier fringes we found a lower-quality, nonwrapped phase map. The nonwrapped estimation is used as stepping stone for dual-sensitivity temporal phase unwrapping, extending the applicability of the technique to discontinuous (piecewise continuous) surfaces. We are proposing a single defocusing level for faster high- and low-frequency fringe data acquisition. The proposed technique is validated with experimental results.