Dual frequency modulation with two cantilevers in series: a possible means to rapidly acquire tip–sample interaction force curves with dynamic AFM

Abstract

One common application of atomic force microscopy (AFM) is the acquisition of tip–sample interaction force curves. However, this can be a slow process when the user is interested in studying non-uniform samples, because existing contact- and dynamic-mode methods require that the measurement be performed at one fixed surface point at a time. This paper proposes an AFM method based on dual frequency modulation using two cantilevers in series, which could be used to measure the tip–sample interaction force curves and topography of the entire sample with a single surface scan, in a time that is comparable to the time needed to collect a topographic image with current AFM imaging modes. Numerical simulation results are provided along with recommended parameters to characterize tip–sample interactions resembling those of conventional silicon tips and carbon nanotube tips tapping on silicon surfaces.